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Finding defects



Negevtech.jpg


Lots of new metrology systems are rolling out this year, including this system from Negevtech, a new entrant in the market. The company claims its Step and Image technology gives higher defect sensitivity and higher throughput at lower cost than competing inspection systems. Image courtesy Negevtech.


30 June 2003 07:31 PM | Comments (0) | TrackBack (0)

 


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